[Beowulf] Not quite Walmart, or, living without ECC?
lindahl at pbm.com
Mon Nov 26 13:53:45 PST 2007
On Mon, Nov 26, 2007 at 12:27:03PM -0800, David Mathog wrote:
> Anyway, this was the best test I could
> find for detecting the occasional gamma ray type data loss event.
I always thought that the bit fade test was aimed at finding
manufacturing defects and the like.
> On the web there are references to an IBM study which found 1 bit
Note that the size of the memory chip plays into the rate, so you
can't directly compare with that number. (bigger chip = higher rate,
smaller fab process = lower rate, different fab process = different
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